Specimen Preparation for Electron Microscopy

Das, Samar (1995) Specimen Preparation for Electron Microscopy. In: Experimental Techniques in Industrial Metallography [ETIM-95], Nov.27 to Dec. 1, 1995, National Metallurgical Laboratory(CSIR), Jamshedpur.



The purpose of electron microscopy is to study accurately the microstructures at high resolution and defect struc-ture in a material. The knowledge of suitable sample preparation technique is essential for preparing a good representative sample of the material. The preparation techniques for SEM and Tem samples are different.

Item Type:Conference or Workshop Item (Paper)
Official URL/DOI:http://eprints.nmlindia.org/4335
Uncontrolled Keywords:microscopes; optical microscopy; electron microscopy
Divisions:Material Science and Technology
ID Code:4335
Deposited By:Sahu A K
Deposited On:29 Nov 2011 11:14
Last Modified:01 Dec 2011 15:55
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