Das, Samar (1995) Specimen Preparation for Electron Microscopy. In: Experimental Techniques in Industrial Metallography [ETIM-95], Nov.27 to Dec. 1, 1995, National Metallurgical Laboratory(CSIR), Jamshedpur.
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Official URL/DOI: http://eprints.nmlindia.org/4335
Abstract
The purpose of electron microscopy is to study accurately the microstructures at high resolution and defect struc-ture in a material. The knowledge of suitable sample preparation technique is essential for preparing a good representative sample of the material. The preparation techniques for SEM and Tem samples are different.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Uncontrolled Keywords: | microscopes; optical microscopy; electron microscopy |
| Subjects: | Materials Science |
| Divisions: | Material Science and Technology |
| Depositing User: | Users 5 not found. |
| Date Deposited: | 29 Nov 2011 05:44 |
| Last Modified: | 01 Dec 2011 10:25 |
| URI: | http://eprints.nmlindia.org/id/eprint/4335 |
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