Advanced Techiques for Trace Elements Characterisation of Materials

Mathews, C K (1994) Advanced Techiques for Trace Elements Characterisation of Materials. In: Proceedings of the Workshop on Modern Methods of Chemical Analysis for Minerals Metals and Pollutants (MMCA 1994), January 18-20, 1994, National Metallurgical Laboratory, Jamshedpur.



Modern technology uses high purity materials which have to be characterised by measuring impurities at trace levels. For example, properties of semiconductors are influened by dopants present at parts per trillion (ppt). Nuclear Materials must be free from neutron absorbing elements below parts per million (ppm) or parts per billion (ppb). The distance over which signals can be communicated in an optical fibre depends on its purity. Characterisation of all such materials requires analytical techniques of adequate sensitivity.

Item Type:Conference or Workshop Item (Paper)
Official URL/DOI:
Uncontrolled Keywords:Semiconductors; high sensivity; high selectivity
Divisions:Analytical Chemistry
ID Code:4302
Deposited By:Sahu A K
Deposited On:21 Nov 2011 09:48
Last Modified:12 Dec 2011 17:46
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