Advanced Techiques for Trace Elements Characterisation of Materials

Abstract

Modern technology uses high purity materials which have to be characterised by measuring impurities at trace levels. For example, properties of semiconductors are influened by dopants present at parts per trillion (ppt). Nuclear Materials must be free from neutron absorbing elements below parts per million (ppm) or parts per billion (ppb). The distance over which signals can be communicated in an optical fibre depends on its purity. Characterisation of all such materials requires analytical techniques of adequate sensitivity.