Das, Samar (1995) Specimen Preparation for Electron Microscopy. In: Experimental Techniques in Industrial Metallography [ETIM-95], Nov.27 to Dec. 1, 1995, National Metallurgical Laboratory(CSIR), Jamshedpur.
The purpose of electron microscopy is to study accurately the microstructures at high resolution and defect struc-ture in a material. The knowledge of suitable sample preparation technique is essential for preparing a good representative sample of the material. The preparation techniques for SEM and Tem samples are different.
|Item Type:||Conference or Workshop Item (Paper)|
|Uncontrolled Keywords:||microscopes; optical microscopy; electron microscopy|
|Divisions:||Material Science and Technology|
|Deposited By:||Sahu A K|
|Deposited On:||29 Nov 2011 11:14|
|Last Modified:||01 Dec 2011 15:55|
Repository Staff Only: item control page