Characterization of different samples by Atomic Force Microscopy

Pramanick, A K and Sinha, Arvind and Nayar, S and Dragieva, I (2008) Characterization of different samples by Atomic Force Microscopy. In: Nanoscience and Nanotechnology-8. Prof. Marin Drinov Academic Publishing House, Sofia, 2008, Sofia, pp. 257-262. ISBN 1311-9702

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Atomic Force Microscopy (AFM) finds wide scale appli-cation in the field of surface characterization of nanostructured materials including polymers, ceramics, biological and metallic materials. In metallic materials characterization by AFM, deformation dislocation slip steps of duplex steel in micrometer scale has been rep-orted. But study of twins or grain boundary sigma relat-ion by AFM will be interesting. Also, the use of AFM in characterization of different kinds of nanomaterials produced by biomimetic route is a fascinating task. This paper is a mini-review of AFM, its different modes of operation, advantages and attractive applications in nanostructured realm.

Item Type:Book or NML Publication
Official URL/DOI:
Uncontrolled Keywords:micrometer scale; nanostructured realm; biomimetic route; atomic force microscope
Divisions:Material Science and Technology
ID Code:5658
Deposited By:Sahu A K
Deposited On:02 Jul 2012 16:48
Last Modified:04 Sep 2012 10:40
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