Energy-dispersive x-ray-analysis of binary and quaternary systems

Prakash, Hari (1987) Energy-dispersive x-ray-analysis of binary and quaternary systems. Indian journal of chemistry section a-inorganic bio-inorganic physical theoretical & analytical chemistry, 26 (5). pp. 440-444.

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Energy-dispersive X-ray (EDX) analysis of some binary and quaternary systems is described. Detectability limits system resolution and precision have been-measured for an experimental equipment consisting of an Ortec NS-600 X-ray spectrometer, having a lithium-drifted silicon detector system, interfaced with a Jeolco JSM-2 scanning electron microscope. An unusual matrix effect for sulphur has been observed which indicates that an element, otherwise pres-ent in an unknown specimen, might not be detected by using EDX.

Item Type:Article
Official URL/DOI:
Uncontrolled Keywords:x-ray-analysis; binary and quaternary systems; sulphur; quaternary systems
Divisions:Director Office
ID Code:5238
Deposited By:Sahu A K
Deposited On:11 May 2012 16:55
Last Modified:12 Feb 2013 17:46
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