Thickness-dependent fcc–hcp phase transformation in polycrystalline titanium thin films

Chakraborty, Jay and Kumar, Kishor and Ranjan, Rajeev and Ghosh Chowdhury, S and Singh, S R (2011) Thickness-dependent fcc–hcp phase transformation in polycrystalline titanium thin films. Acta Materialia, 59 (7). pp. 2615-2623.

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Polycrystalline Ti thin films are shown to gradually transform from face-centered cubic (fcc) to hexagonal close-packed structure (hcp) with increasing film thickness. Diffraction stress analysis revealed that the fcc phase is formed in a highly compressive hcp matrix (⩾2 GPa), the magnitude of which decreases with increasing film thickness. A correlation between stress and crystallographic texture vis-à-vis the fcc–hcp phase transformation has been established. The total free energy change of the system upon phase transformation calculated using the experimental results shows that the fcc–hcp transformation is theoretically possible in the investigated film thickness regime (144–720 nm) and the hcp structure is stable for films thicker than 720 nm, whereas the fcc structure can be stabilized in Ti films much thinner than 144 nm.

Item Type:Article
Official URL/DOI:
Uncontrolled Keywords:X-ray diffraction; Phase transformation; Stress; Texture
Divisions:Material Science and Technology
ID Code:4236
Deposited By:Dr. A K Sahu
Deposited On:05 Nov 2011 14:07
Last Modified:24 Oct 2013 15:09
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