Scanning electron microscopy: basic principles and applications

Sridhar, G (1999) Scanning electron microscopy: basic principles and applications. In: Materials characterization techniques: principles and applications. NML, Jamshedpur, pp. 91-107. ISBN 81-87053-29-1

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Scanning Electron Microscope (SEM) can reveal topological details of a surface with clarity and detail which cannot he obtained by any other means. The last two decades have, however, seen a remarkable growth in the use of SEM in materials research and increasing so¬phistication of the instrumentation associated with the microscope. In the present lecture. attention has been paid to the basic principles u nderhing construction of the microscope. image formation in the microscope and the nature of electron-specimen interaction that en¬ables collection of information pertaining to the topographic, struc¬tural and chemical nature of the specimen being studied. In addition, the importance of SEM in the fractographic studies as well as failure analysis is included in the present paper.

Item Type:Book or NML Publication
Uncontrolled Keywords:Scanning Electron Microscopy; Microscopy
Divisions:Material Science and Technology
ID Code:1814
Deposited On:04 Oct 2010 16:16
Last Modified:04 Oct 2010 16:16
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