Pramanick, A K and Sinha, Arvind and Sastry, G V S and Ghosh, R N (2009) Near-grain-boundary characterization by atomic force microscopy. Ultramicroscopy, 109 (6). pp. 741-747.
![[img]](/style/images/fileicons/application_pdf.png) | PDF Restricted to NML users only. Others may use -> 1648Kb |
Abstract
Characterization of near-grain boundary is carried out by atomic force microscopy (AFM). It has been observed to be the most suitable technique owing to its capability to investigate the surface at high resolution. Commercial purity-grade nickel processed under different conditions, viz., (i) cold-rolled and annealed and (ii) thermally etched condition without cold rolling, is considered in the present study. AFM crystallographic data match well with the standard data. Hence, it establishes two grain-boundary relations viz., plane matching and coincidence site lattice (CSL Σ=9) relation for the two different sample conditions.
| Item Type: | Article |
|---|---|
| Official URL/DOI: | http://dx.doi.org/10.1016/j.ultramic.2009.01.014 |
| Uncontrolled Keywords: | Sigma relation; Coincidence site lattice; AFM; Plane matching |
| Divisions: | Material Science and Technology |
| ID Code: | 672 |
| Deposited By: | INVALID USER |
| Deposited On: | 02 Jun 2010 12:21 |
| Last Modified: | 08 Feb 2012 12:03 |
| Related URLs: |
Repository Staff Only: item control page
