Measurement of dielectric properties of medium loss samples at X-band frequencies

Abstract

This work describes and evaluates a technique for determining dielectric properties, and presents results of dielectric measurement of some substances. Dielectric properties of some known dielectric materials are first measured and verified with our technique and then applied to conducting polymer materials. A non-destructive method based on the shift in resonance frequency and quality factor measurement of a resonant cavity placing a small-sized sample is used. Dielectric constant and loss factor measurement is performed with the aid of Spectrum Analyzer in the frequency range from 8GHZ to 12GHz. 3-D EM simulation studies using HFSS 11 software of the cavity with loading is compared with the measurement. The results indicated that using the resonant cavity with the technique is suitable for dielectric parameter measurement for small shaped medium loss samples having thickness in the range 4-6mm at X-Band frequencies.