Devi, S and Bose, S K (1977) Quantitative estimation of elements and compounds by x-ray integrated intensity measurements. NML Technical Journal, 19 (2). pp. 39-43.
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Abstract
Power formula expression for x-ray integrated intensity has been applied using diffractometric line profiles for quantitative estimation of crystalline phases existing in form of element and compound using binary and ternary mixtures of Cn-Ni, Cu-Fe, Cu-Al, Cu-Ni-Al, quartz, cryolite and alumina-crylolite of various proportions. Since the expression takes into account of the crystal structure and atomic sites, it is therefore possible to determine compositions of elements and compounds without the use of standard samples and the result thus obtained in these cases are found to be within an accuracy ± 2%. (Mrs. S.M. Devi Senior Laboratory Assistant, Shri S.K. Bose, Scientist, National Metallurgical Laboratory)
| Item Type: | Article |
|---|---|
| Official URL/DOI: | http://library/articleDetails.jsp?recordid=357 |
| Uncontrolled Keywords: | X-ray integrated intensity; Cn-Ni Compound; Alumina-crylolite; Cu-Ni-Al compound |
| Divisions: | Material Science and Technology |
| ID Code: | 2199 |
| Deposited By: | Dr. A K Sahu |
| Deposited On: | 28 Dec 2010 10:42 |
| Last Modified: | 19 Mar 2012 12:48 |
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