Panda, A K and Ghosh Chowdhury, S and Mitra, A and Nishiyama, N (2006) Electron transport behaviour and soft magnetic properties of bulk amorphous Fe72Si4B20Nb4 alloy. Journal of Physics D: Applied Physics, 39 . pp. 3536-3542.
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Abstract
The crystallization behaviour, electrical resistivity, magnetic and mechanical properties of as-quenched bulk amorphous Fe72Si4B20Nb4 alloy was investigated. The alloy, prepared in the form of rods by a copper mould casting technique, revealed an amorphous structure as observed from x-ray diffractometry. Differential scanning calorimetry and thermal variation of electrical resistivity measurements showed distinct glass transition temperature, Tg occurring 50–60K below the crystallization onset (TX). Such a wide supercooled range was also attributed to the highly reduced glass transition temperature, Trg which was in the range of 0.56–0.58 found to be prevalent in good glass forming alloys. The alloy also showed a non-linear decrease in stability time at different temperatures between Tg and TX. The bulk amorphous alloy exhibited a drastic decrease in electrical resistivity around the glass transition temperature which was attributed to high electron propagation due to enhanced stress relaxation as result of a decrease in viscosity. The material exhibited superior soft magnetic properties with a coercivity value of 212 mOe, which is fairly low with respect to reported bulk amorphous alloys. The amorphous alloy also showed saturation induction of 12 kG and a moderate Curie temperature of 595 K. The as-quenched bulk amorphous alloy exhibited a high mechanical hardness of 1250HV (Vickers). The superior soft magnetic properties coupled with high mechanical hardness opens up the scope for bulk amorphous Fe–Si–B systems with Nb incorporation.
Item Type: | Article |
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Official URL/DOI: | http://doi:10.1088/0022-3727/39/16/003 |
Uncontrolled Keywords: | Electron transport; Amorphous Fe72Si4B20Nb4 alloy |
Divisions: | Material Science and Technology |
ID Code: | 1519 |
Deposited By: | INVALID USER |
Deposited On: | 01 Sep 2010 16:09 |
Last Modified: | 06 Feb 2012 17:40 |
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