Diffraction stress analysis of fiber textured Ti thin films undergoing hcp - fcc phase transformation

Abstract

X-ray diffraction stress analysis by crystallite group method (CGM) has been employed in case of simultaneously strong and sharp fiber textured Ti thin films. These Ti films exhibit thickness dependent hop-fcc phase transformation [Ref. 1]. Diffraction stress analysis has also been attempted by d-sin(2)psi method for strongly textured face centered cubic (fcc) and hexagonal close packed (hop) Ti phases. For hcp Ti phase, the results of stress analysis by CGM are compared with those obtained from d-sin(2)psi method. It is found that the stress values in hop Ti phases obtained from CGM considerably differ from the stresses obtained from d-sin(2)psi method in some of the Ti films Observed differences have been explained and possible sources of errors in d-sin(2)psi method and CGM stress analysis have been discussed