Characterization of different samples by Atomic Force Microscopy

Atomic Force Microscopy (AFM) finds wide scale appli-cation in the field of surface characterization of nanostructured materials including polymers, ceramics, biological and metallic materials. In metallic materials characterization by AFM, deformation dislocation slip steps of duplex steel in micrometer scale has been rep-orted. But study of twins or grain boundary sigma relat-ion by AFM will be interesting. Also, the use of AFM in characterization of different kinds of nanomaterials produced by biomimetic route is a fascinating task.
This paper is a mini-review of AFM, its different modes
of operation, advantages and attractive applications in nanostructured realm.