Prakash, Hari (1987) Energy-dispersive x-ray-analysis of binary and quaternary systems. Indian journal of chemistry section a-inorganic bio-inorganic physical theoretical & analytical chemistry, 26 (5). pp. 440-444.
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Abstract
Energy-dispersive X-ray (EDX) analysis of some binary and
quaternary systems is described. Detectability limits system resolution and precision have been-measured for an experimental equipment consisting of an Ortec NS-600 X-ray spectrometer, having a lithium-drifted silicon detector system, interfaced with a Jeolco JSM-2 scanning electron microscope. An unusual matrix effect for sulphur has been observed which indicates that an element, otherwise pres-ent in an unknown specimen, might not be detected by using EDX.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | x-ray-analysis; binary and quaternary systems; sulphur; quaternary systems |
| Subjects: | Materials Science |
| Divisions: | Director Office |
| Depositing User: | Users 5 not found. |
| Date Deposited: | 11 May 2012 11:25 |
| Last Modified: | 12 Feb 2013 12:16 |
| URI: | http://eprints.nmlindia.org/id/eprint/5238 |
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