Devi, S and Bose, S K (1977) Quantitative estimation of elements and compounds by x-ray integrated intensity measurements. NML Technical Journal, 19 (2). pp. 39-43.
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Abstract
Power formula expression for x-ray integrated intensity has been applied using diffractometric line profiles for quantitative estimation of crystalline phases existing in form of element and compound using binary and ternary mixtures of Cn-Ni, Cu-Fe, Cu-Al, Cu-Ni-Al, quartz, cryolite and alumina-crylolite of various proportions. Since the expression takes into account of the crystal structure and atomic sites, it is therefore possible to determine compositions of elements and compounds without the use of standard samples and the result thus obtained in these cases are found to be within an accuracy ± 2%. (Mrs. S.M. Devi Senior Laboratory Assistant, Shri S.K. Bose, Scientist, National Metallurgical Laboratory)
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | X-ray integrated intensity; Cn-Ni Compound; Alumina-crylolite; Cu-Ni-Al compound |
| Subjects: | Materials Science |
| Divisions: | Material Science and Technology |
| Depositing User: | Dr. A K Sahu |
| Date Deposited: | 28 Dec 2010 05:12 |
| Last Modified: | 19 Mar 2012 07:18 |
| URI: | http://eprints.nmlindia.org/id/eprint/2199 |

