Ghosh Chowdhury, S (1999) X-ray diffraction: principles and its application to structural analysis. In: UNSPECIFIED.
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X-rays are invisible in nature but having more penetrating power compared to light was used by the physicians since its invention. Later, with the development of diffraction theory, X-ray diffraction (XRD) has become an important diagnostic and analytical tool with a broad range of applications. Initially it was used only for research purposes; however, continuing research have been devoted on it to diversify its applications. Presently, XRD is used in the industry for materials characterisation and procrss control. In the following, the basic principles related to X-ray diffraction have been introduced and the implications of those principles for materials characterisation, i.e., crystal structure determination and crystallographic phase analysis have been described with suitable examples. Measurement and analysis of texture, an important parameter for materials characterisation, is also discussed in this chapter.
|Item Type:||Conference or Workshop Item (UNSPECIFIED)|
|Uncontrolled Keywords:||XRD; X-ray diffraction|
|Divisions:||Material Science and Technology|
|Deposited By:||INVALID USER|
|Deposited On:||04 Oct 2010 16:17|
|Last Modified:||13 Jan 2012 11:53|
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